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The Effect of Series and Shunt Redundancy on Power Semiconductor Reliability
Mohsen Hasan Babayi Nozadian  Mohammad Shadnam Zarbil  Mehdi Abapour
Vol. 16, No. 4, pp. 1426-1437, Jul. 2016
10.6113/JPE.2016.16.4.1426

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  ISSN : 1598 - 2092
eISSN : 2093 - 4718